Präsentation auf dem ITG/GMM Workshop "Testmethoden und Zuverlässigkeit 2006", Titisee, Deutschland, März 2006
Inhalt: A new approach to adding built-in self test (BIST) capabilities to integrated sigma-delta modulation RF transmitters is presented. An area efficient, all-digital building block generates multitone FM stimulus signals without compromising the performance of the RF transmitter itself. The RF signal is demodulated and digitized in a on-chip digital FM discriminator. Both blocks are fully testable using standard scan chain methods and consume a chip area of only 0.03 mm2 in a 130 nm CMOS technology. The spectral quality and reproducibility of the test signals are suitable for intermodulation distortion tests or PLL frequency response measurements.
| © Christian Münker [ 04. Jul 2006 ] |
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